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SEM/EDS法和XRF法在电工胶带检验中的应用
引用本文:孙振文,权养科,陶克明.SEM/EDS法和XRF法在电工胶带检验中的应用[J].中国司法鉴定,2012(2):26-29.
作者姓名:孙振文  权养科  陶克明
作者单位:1. 中国人民公安大学,北京100038;公安部物证鉴定中心,北京100038
2. 公安部物证鉴定中心,北京,100038
基金项目:中国人民公安大学学科建设与研究生创新项目,基本科研业务费专项资金重点项目
摘    要:目的探索电工胶带带基的元素检验方法。方法利用扫描电镜/能谱法(SEM/EDS)对电工胶带带基中的主体元素进行定量分析,通过SPSS软件对SEM/EDS定量分析法检测出的主体元素(Cl和Ca)相对含量进行统计分析;利用X射线荧光光谱法(XRF)对电工胶带带基中的微量元素进行定性分析。结果34个品牌红色电工胶带组成的561组样品对通过SEM/EDS定量分析法可以区分539组,区分率达到96.1%;根据XRF法定性分析测出的Mg、Al、Si、S、Ti、Sb、Ba、Pb微量元素的不同组合可将34种电工胶带分成11组,两种方法结合可使不同品牌红色电工胶带的区分率达到98.4%。结论SEM/EDS法和XRF法结合可以实现同种颜色、不同品牌电工胶带的高效区分。

关 键 词:电工胶带  带基  扫描电镜/能谱法  X射线荧光光谱法  元素分析

The Application of SEM/EDS and XRF Methods in Insulation Tapes Analysis
SUN Zhen-wen , QUAN Yang-ke , TAO Ke-ming.The Application of SEM/EDS and XRF Methods in Insulation Tapes Analysis[J].Chinese Journal of Forensic Sciences,2012(2):26-29.
Authors:SUN Zhen-wen  QUAN Yang-ke  TAO Ke-ming
Institution:1.Chinese People’s Public Security University,Beijing 100038,China; 2.Institute of Forensic Science,Ministry of Public Security,Beijing 100038,China)
Abstract:Objective To study the analytical methods of the elements in the backing of insulation tapes of the same color.Method Scanning electron microscopy/energy dispersive spectroscopy(SEM/EDS) was used for determining the relative amounts of two main elements,Cl and Ca,in the backing,and SPSS software was used for statistical analysis.X-ray fluorescence(XRF) was used for detecting the trace elements.Results Through the SEM/EDS quantitative analysis by comparing the relative amounts of Cl and Ca,539 sample groups could be distinguished from the total 561 groups,and the discrimination rate was 96.1%.Based on the XRF qualitative analysis,34 brands of red insulation tapes were divided into 11 groups according to their different combinations of Mg、Al、Si、S、Ti、Sb、Ba、Pb.The total discrimination rate was 98.4% when combining these two methods.Conclusion SEM/EDS and XRF methods can be used to distinguish different brands of insulation tapes of the same color.
Keywords:insulation tape  backing  SEM/EDS  XRF  elemental analysis
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