Analysis of pressure sensitive adhesive tape: I. Evaluation of infrared ATR accessory advances

Attenuated total reflection (ATR), also known as internal reflection spectroscopy (IRS), is a forensically accepted method for infrared (IR) analysis of pressure sensitive adhesive tapes. Advancements of ATR accessories in the last decade have provided the forensic examiner several ATR methods to choose from. These accessories offer a variety of ATR crystal choices with a variety of prices and capabilities. Four different types of pressure sensitive adhesive tapes including duct tape, electrical tape, packaging tape and office tape have been used to compare six different ATR methods. Each of the methods tested offers both benefits and limitaltions which must be considered for the type of sample to be analyze. The intent of this paper is to assist the reader in better understanding ATR techniques, the many differences among currently available ATR accessories and how the method is applied to the analysis of pressure sensitive adhesive tape.     

Infrared spectroscopic imaging for noninvasive detection of latent fingerprints

The capability of Fourier transform infrared (FTIR) spectroscopic imaging to provide detailed images of unprocessed latent fingerprints while also preserving important trace evidence is demonstrated. Unprocessed fingerprints were developed on various porous and nonporous substrates. Data-processing methods used to extract the latent fingerprint ridge pattern from the background material included basic infrared spectroscopic band intensities, addition and subtraction of band intensity measurements, principal components analysis (PCA) and calculation of second derivative band intensities, as well as combinations of these various techniques. Additionally, trace evidence within the fingerprints was recovered and identified.