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Visualization of fingerprints in the scanning electron microscope.
Authors:G E Garner  C R Fontan  D W Hobson
Affiliation:1. Electron Microscope Center, Washington State University, Pullman, Washington 99163;2. Department of Police Science and Administration, Washington State University, Pullman, Washington 99163;1. School of Chemical Engineering, Yeungnam University, Gyeongsan, Gyeongbuk 38541, Republic of Korea;2. Wroclaw University of Science and Technology, Faculty of Electronics, Photonics and Microsystems, Department of Nanometrology, Janiszewskiego 11/17, 50-372 Wrocław, Poland;3. Department of Physics, Savitribai Phule Pune University, Pune 411007, M.S., India;4. Department of Electronic Sciences, Savitribai Phule Pune University, Pune 411007, M.S., India;1. CAS Key Laboratory of Green Printing and State Key Laboratory of Polymer Physics and Chemistry, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China;2. University of Chinese Academy of Sciences, Beijing 100049, China;1. College of Chemistry and Chemical Engineering, Guizhou University, Guiyang, Guizhou Province 550025, PR China;2. Department of Chemistry, Tsinghua University, Beijing 100084, PR China;1. School of Information Science and Engineering, Chengdu University, Chengdu 610106, PR China;2. Department of Applied Mathematics, University of Waterloo, Waterloo, Ontario, Canada N2L 3G1;3. School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, PR China;4. School of Mathematical Sciences, University of Electronic Science and Technology of China, Chengdu 611731, PR China;5. Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621999, PR China;1. Department of Computer Science, COPPE, Federal University of Rio de Janeiro, Brazil;2. High Performance Computing Center, COPPE, Federal University of Rio de Janeiro, Brazil;3. Department of Civil Engineering, COPPE, Federal University of Rio de Janeiro, Brazil;4. Institute of Computing, Fluminense Federal University, Brazil;5. Inria, France;6. LIRMM, France
Abstract:
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