| 对后配钥匙开启弹子锁痕迹的研究 |
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| 引用本文： | 雷中坚,俞文. 对后配钥匙开启弹子锁痕迹的研究[J]. 河北公安警察职业学院学报, 2005, 5(3): 27-28 |
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| 作者姓名： | 雷中坚 俞文 |
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| 作者单位： | 甘肃政法学院公安分院,甘肃,兰州,730070;甘肃政法学院公安分院,甘肃,兰州,730070 |
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| 摘 要： | 本文通过对原配钥匙与后配钥匙在弹子锁内形成痕迹的比较,分析了后配钥匙形成痕迹的原因及影响因素,为正确认识开锁痕迹作了一定的探索。
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| 关 键 词： | 后配钥匙 原配钥匙 弹子锁 擦划线条 |
| 文章编号： | 1672-6405(2005)03-0027-02 |
| 修稿时间： | 2005-06-20 |
Research on the Traces Left in Spring Locks by Duplicate Keys |
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| Lei Zhongjian,Yu Wen. Research on the Traces Left in Spring Locks by Duplicate Keys[J]. Journal of Hebei Vocational College of Public Security Police, 2005, 5(3): 27-28 |
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| Authors: | Lei Zhongjian Yu Wen |
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| Abstract: | The article analyzes the reasons and affecting elements for the traces left by duplicate keys compared with the traces left in spring locks by original keys , thus does some research in distinguishing unlocking traces. |
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| Keywords: | duplicate key original key spring lock scratched line |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
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