Analysis of mutations in father–son pairs with 17 Y-STR loci |
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Authors: | Amy E. Decker Margaret C. Kline Janette W. Redman Thomas M. Reid John M. Butler |
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Affiliation: | aBiochemical Science Division, National Institute of Sciences and Technology, Gaithersburg, MD 20899-8311, United States;bDNA Diagnostics Center, Fairfield, OH 45014, United States |
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Abstract: | We have examined 389 father/son sample pairs from U.S. Caucasians, African Americans, Hispanics and Asians using the 17 Y-STR loci in the Yfiler™ kit and observed a total of 24 differences between father and son. Thirteen mutations resulted in the gain of a repeat in the son and 11 resulted in a loss of a repeat. All samples resulted in single repeat mutations except one sample which contained a two repeat loss at Y-GATA-H4. Furthermore, two different sample pairs were found to have two mutations. An African American sample pair had a mutation at DYS458 and a second at DYS635 and an Asian sample pair had mutations at DYS439 and Y-GATA-H4. |
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Keywords: | Short tandem repeat DNA Y-STR Mutation rate DYS19 DYS385a/b DYS389I DYS389II DYS390 DYS391 DYS392 DYS393 DYS437 DYS438 DYS439 DYS448 DYS456 DYS458 |
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