首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Classification of counterfeit coins using multivariate analysis with X-ray diffraction and X-ray fluorescence methods
Institution:1. Dipartimento di Chimica e Farmacia, Università degli Studi di Sassari, via Muroni 23A, 07100 Sassari, SS, Italy;2. Molecular Simulations Engineering (MOSE) Laboratory, DEA, University of Trieste, Piazzale Europa 1, 34127 Trieste, Italy;3. National Interuniversity Consortium for Material Science and Technology (INSTM), Research Unit MOSE-DEA, University of Trieste, Piazzale Europa 1, 32127 Trieste, Italy;4. Dipartimento di Chimica e Tecnologie del Farmaco, Sapienza, Università di Roma, P.le Aldo Moro, 5, 00185 Roma, Italy;5. Dipartimento di Scienze Biomediche, Sezione di Microbiologia e Virologia, Università Cagliari, Cittadella Universitaria, 09042 Monserrato, Italy;1. Jiangsu Key Laboratory of Materials Surface Science and Technology, Changzhou University, 213164 Jiangsu, PR China;2. Jiangsu Collaborative Innovation Center of Photovolatic Science and Engineering, Changzhou University, 213164 Jiangsu, PR China;1. Shenzhen Graduate School, Harbin Institute of Technology, Shenzhen, Guangdong 518055, China;2. School of Computing, Informatics, Decision Systems Engineering, Arizona State University, Tempe, AZ 85287, USA;3. Department of Industrial and Systems Engineering, Mississippi State University, Mississippi State, MS 39762, USA;4. Department of Operational Sciences, Graduate School of Engineering & Management, Air Force Institute of Technology, Wright-Patterson AFB, OH 45433, USA;1. Department of Legal Medicine, Graduate School of Medicine, Nippon Medical School, Tokyo, Japan;2. Shimadzu Corporation Global Application Development Center, Hadano, Kanagawa, Japan
Abstract:Counterfeit coins (277 samples) were analyzed by both X-ray diffraction (XRD) and X-ray fluorescence (XRF) methods without any pretreatment. The counterfeit coins were clearly classified into two groups using cluster analysis (CA) and principal component analysis (PCA) for XRD peak patterns. One group (250 samples) was made by a pressed method and another one (27 samples) was made by a nickel-plated method. Using four elements (Cu, Ni, Fe and Zn) and obtaining XRF for 257 samples, they could be divided into four groups by CA. On the other hand, they were classified into five groups using their diameter, thickness, weight, density, density/thickness and density/weight. The latter classification method would suggest something of a change in the process of the pressed method.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号